Properties of nanostructured and amorphous films in the TiB 2-B4C system

G. V. Kalinnikov, R. A. Andrievski, V. N. Kopylov, D. Louzguine

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Nanostructured and x-ray-amorphous films in the TiB2-B 4C system are prepared by nonreactive magnetron sputtering in the absence and presence of an additional external magnetic field with inductions of up to 0.3 T. The properties of the deposited films, such as the grain size, phase composition, dominant texture, roughness, and hardness, are investigated using transmission electron microscopy, microdiffraction, x-ray powder diffraction, atomic force microscopy, and microdurometry. The specific features of the phase diagram as applied to films and the effect of application of the magnetic field on their properties are discussed.

Original languageEnglish
Pages (from-to)374-378
Number of pages5
JournalPhysics of the Solid State
Volume50
Issue number2
DOIs
Publication statusPublished - 2008 Feb

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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