Profile measurement of micro-aspheric surface by a small-scale measuring instrument

Atsushi Shibuya, Yoshikazu Arai, Yasuo Yoshikawa, Wei Gao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
Publication statusPublished - 2008 Dec 1
Event23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE - Portland, OR, United States
Duration: 2008 Oct 192008 Oct 24

Publication series

NameProceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Other

Other23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
CountryUnited States
CityPortland, OR
Period08/10/1908/10/24

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Shibuya, A., Arai, Y., Yoshikawa, Y., & Gao, W. (2008). Profile measurement of micro-aspheric surface by a small-scale measuring instrument. In Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).