TY - JOUR
T1 - Processing and characterization of hydroxyapatite coatings on titanium produced by magnetron sputtering
AU - Nieh, T. G.
AU - Jankowski, A. F.
AU - Koike, J.
N1 - Funding Information:
This work was performed under the auspices of the United States Department of Energy by Lawrence Livermore National Laboratory under Contract No. W-7405-Eng-48. The authors want to thank Dr. W. Choi for carrying out the nanoindentation tests.
PY - 2001/11
Y1 - 2001/11
N2 - Hydroxyapatite (HA) coatings with different thicknesses were produced on Ti and Si substrates using the radio frequency magnetron sputtering method. The mechanical properties, for example, modulus and hardness, of the coatings were measured using nanoindentation. The measured values of modulus and hardness were close to the upper limit of that reported for bulk HA, indicating a fully dense structure. Interfacial strengths between the HA coatings and substrates were also evaluated using a nanoscratch technique. The HA-Ti interface appeared to be stronger than the HA-Si interface. The microstructures of the HA coating and the HA-Ti interface were examined using high-resolution electron microscopy. Chemical compositions of the HA coating and the HA-Ti interface were also analyzed using x-ray energy dispersive spectrometer and electron energy loss spectroscopy. The results indicated that the strong HA-Ti bonding is associated with an outward diffusion of Ti into HA layer and concomitant formation of TiO2 at or near the interface.
AB - Hydroxyapatite (HA) coatings with different thicknesses were produced on Ti and Si substrates using the radio frequency magnetron sputtering method. The mechanical properties, for example, modulus and hardness, of the coatings were measured using nanoindentation. The measured values of modulus and hardness were close to the upper limit of that reported for bulk HA, indicating a fully dense structure. Interfacial strengths between the HA coatings and substrates were also evaluated using a nanoscratch technique. The HA-Ti interface appeared to be stronger than the HA-Si interface. The microstructures of the HA coating and the HA-Ti interface were examined using high-resolution electron microscopy. Chemical compositions of the HA coating and the HA-Ti interface were also analyzed using x-ray energy dispersive spectrometer and electron energy loss spectroscopy. The results indicated that the strong HA-Ti bonding is associated with an outward diffusion of Ti into HA layer and concomitant formation of TiO2 at or near the interface.
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U2 - 10.1557/JMR.2001.0446
DO - 10.1557/JMR.2001.0446
M3 - Article
AN - SCOPUS:0035521921
VL - 16
SP - 3238
EP - 3245
JO - Journal of Materials Research
JF - Journal of Materials Research
SN - 0884-2914
IS - 11
ER -