TY - GEN
T1 - Process tomography of coherent state transfer from light polarization to electron spin polarization in a semiconductor
AU - Kosaka, Hideo
AU - Inagaki, T.
AU - Mitsumori, Y.
AU - Edamatsu, K.
PY - 2013/10/18
Y1 - 2013/10/18
N2 - We demonstrate process tomography of coherent state transfer. We estimated process fidelity of the state transfer to be 81% and clarified that the phase-flip error is the major contribution to the fidelity degradation.
AB - We demonstrate process tomography of coherent state transfer. We estimated process fidelity of the state transfer to be 81% and clarified that the phase-flip error is the major contribution to the fidelity degradation.
UR - http://www.scopus.com/inward/record.url?scp=84885444597&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84885444597&partnerID=8YFLogxK
U2 - 10.1109/CLEOPR.2013.6599947
DO - 10.1109/CLEOPR.2013.6599947
M3 - Conference contribution
AN - SCOPUS:84885444597
SN - 9781467364751
T3 - Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
BT - 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
T2 - 10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
Y2 - 30 June 2013 through 4 July 2013
ER -