Probing stem cell differentiation using atomic force microscopy

Xiaobin Liang, Xuetao Shi, Serge Ostrovidov, Hongkai Wu, Ken Nakajima

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

A real-time method using atomic force microscopy (AFM) was developed to probe stem cell differentiation by measuring the mechanical properties of cells and the extracellular matrix (ECM). The mechanical properties of stem cells and their ECMs can be used to clearly distinguish specific stem cell-differentiated lineages. It is clear that AFM is a facile and useful tool for monitoring the differentiation of stem cells in a non-invasive manner.

Original languageEnglish
Pages (from-to)254-259
Number of pages6
JournalApplied Surface Science
Volume366
DOIs
Publication statusPublished - 2016 Mar 15
Externally publishedYes

Keywords

  • Atomic force microscopy
  • Cell mechanical property
  • Extracellular matrix
  • Stem cell differentiation

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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