Probing stem cell differentiation using atomic force microscopy

Xiaobin Liang, Xuetao Shi, Serge Ostrovidov, Hongkai Wu, Ken Nakajima

    Research output: Contribution to journalArticle

    8 Citations (Scopus)

    Abstract

    A real-time method using atomic force microscopy (AFM) was developed to probe stem cell differentiation by measuring the mechanical properties of cells and the extracellular matrix (ECM). The mechanical properties of stem cells and their ECMs can be used to clearly distinguish specific stem cell-differentiated lineages. It is clear that AFM is a facile and useful tool for monitoring the differentiation of stem cells in a non-invasive manner.

    Original languageEnglish
    Pages (from-to)254-259
    Number of pages6
    JournalApplied Surface Science
    Volume366
    DOIs
    Publication statusPublished - 2016 Mar 15

    Keywords

    • Atomic force microscopy
    • Cell mechanical property
    • Extracellular matrix
    • Stem cell differentiation

    ASJC Scopus subject areas

    • Chemistry(all)
    • Condensed Matter Physics
    • Physics and Astronomy(all)
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films

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