Prism-coupled light emission from tunnel junctions containing interface roughness: Experiment

J. Watanabe, A. Takeuchi, Y. Uehara, S. Ushioda

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

We have measured the light-emission characteristics of AlAl oxide Au tunnel junctions that contain residual interface roughness, and compared them with the results of a theory we have just developed [Takeuchi, Watanabe, Uehara, and Ushioda, preceding paper, Phys. Rev. B (to be published)]. The tunnel junctions were formed on a glass substrate, which is attached to a coupler prism. The light-emission intensities were measured as a function of the emission angle and energy, through the prism and on the vacuum side. The theory can fit the emission-angle dependence almost exactly for a reasonable size of roughness. It can also fit the general features of the energy spectra, but some improvements are needed to achieve perfect agreement in detail. Several avenues for further refinements are suggested.

Original languageEnglish
Pages (from-to)12959-12965
Number of pages7
JournalPhysical Review B
Volume38
Issue number18
DOIs
Publication statusPublished - 1988

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Prism-coupled light emission from tunnel junctions containing interface roughness: Experiment'. Together they form a unique fingerprint.

Cite this