Present state of TEM-SXES analysis and its application to SEM aiming chemical analysis of bulk materials

M. Terauchi, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)682-683
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
Publication statusPublished - 2014 Aug 1
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: 2014 Aug 32014 Aug 7

ASJC Scopus subject areas

  • Instrumentation

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