Preparation of silver tips for scanning tunneling microscopy imaging

M. Iwami, Y. Uehara, S. Ushioda

Research output: Contribution to journalArticlepeer-review

50 Citations (Scopus)

Abstract

A simple reliable preparation method of silver tips for scanning tunneling microscopy imaging with atomic resolution is presented. The procedure is based on two-step electrochemical processing; ac electropolishing and subsequent dc electroetching. The quality of the tip is improved by applying high bias voltage pulses while the tip is within tunneling range. This indicates that the end of the tips are sharpened by field evaporation of silver ions.

Original languageEnglish
Pages (from-to)4010-4011
Number of pages2
JournalReview of Scientific Instruments
Volume69
Issue number11
DOIs
Publication statusPublished - 1998 Nov

ASJC Scopus subject areas

  • Instrumentation

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