Preferred orientation of Cu2O nano-/micro-protrusions grown by Ar ion irradiation

Shogo Oda, Hiroyuki Tanaka, Shun Ichiro Tanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed a bottom-up growth technology for nanostructures from a Cu surface by Ar ion irradiation. Cu2O conical nano-/micro- protrusions have been nucleated and grown from the surface of a preoxidized Cu plate by Ar ion irradiation in low vacuum. In this study, the growth direction or preferred orientation of the protrusions was analysed using glancing angle X-ray diffraction (GAXRD) analysis and an X-ray diffraction pole figure (XRD-PF) measurement. The GAXRD patterns showed that the main phase of the product obtained by Ar irradiation was Cu2O, shown as the highest peak of Cu2O (111), and CuO was additionally formed. The intensity ratio of Cu2O (110) to Cu2O (111) increased as the X-ray incident angle decreased from 10.0 to 0.5 deg, which indicated that the basal plane of the protrusions including the substrate was (110). Additionally, the XRD-PF {011}<001> 3-D plots showed the <110> preferred orientation of the product. These results explain that the growth direction or preferred orientation of the Cu2O protrusions is mainly <110>. The growth direction of the protrusions was separated and confirmed as <110> by checking the electron backscatter diffraction pattern (EBSP) of each protrusion.

Original languageEnglish
Title of host publicationTHERMEC 2009
EditorsTara Chandra, Tara Chandra, Tara Chandra, N. Wanderka, N. Wanderka, N. Wanderka, Walter Reimers, Walter Reimers, Walter Reimers, M. Ionescu, M. Ionescu, M. Ionescu
PublisherTrans Tech Publications Ltd
Pages1784-1789
Number of pages6
ISBN (Print)0878492941, 9780878492947
DOIs
Publication statusPublished - 2010 Jan 1
Event6th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2009 - Berlin, Germany
Duration: 2009 Aug 252009 Aug 29

Publication series

NameMaterials Science Forum
Volume638-642
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Other

Other6th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2009
CountryGermany
CityBerlin
Period09/8/2509/8/29

Keywords

  • Ar ion irradiation
  • Glancing angle X-ray diffraction (GAXRD)
  • Growth direction
  • Preferred orientation
  • X-ray pole figure

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Oda, S., Tanaka, H., & Tanaka, S. I. (2010). Preferred orientation of Cu2O nano-/micro-protrusions grown by Ar ion irradiation. In T. Chandra, T. Chandra, T. Chandra, N. Wanderka, N. Wanderka, N. Wanderka, W. Reimers, W. Reimers, W. Reimers, M. Ionescu, M. Ionescu, & M. Ionescu (Eds.), THERMEC 2009 (pp. 1784-1789). (Materials Science Forum; Vol. 638-642). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.638-642.1784