Precisely timed IEMI fault injection synchronized with em information leakage

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

This paper presents a new intentional electromagnetic interference (IEMI) fault injection method that can be used to inject transient faults into cryptographic operations with precise timing from a distance. Such IEMI fault injection can be used for performing fault analysis attacks, such as differential fault analysis and fault sensitivity analysis, and therefore it could pose a severe threat to various cryptographic devices for which it is assumed that attackers cannot acquire direct access. In the proposed IEMI fault injection method, a block (i.e., a period) of sinusoidal waves is injected via cables attached to a cryptographic device, instead of using electromagnetic pulses as in conventional methods. The injected EM waves have a temporary impact on the cryptographic module but not on other components of the device. In addition, the proposed method employs EM information leaked from the cryptographic module as the trigger signal for fault injection. In this paper, we demonstrate experimentally that the proposed method can be used to inject precisely timed faults into the final round of an AES operation.

Original languageEnglish
Title of host publication2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages738-742
Number of pages5
EditionSeptember
ISBN (Electronic)9781479955442
DOIs
Publication statusPublished - 2014 Sep 15
Event2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014 - Raleigh, United States
Duration: 2014 Aug 32014 Aug 8

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
NumberSeptember
Volume2014-September
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
Country/TerritoryUnited States
CityRaleigh
Period14/8/314/8/8

Keywords

  • electromagnetic fault injection
  • Fault sensitivity analysis
  • intentional electromagnetic interference

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Precisely timed IEMI fault injection synchronized with em information leakage'. Together they form a unique fingerprint.

Cite this