Precise structure analyses of advanced materials under high-pressure and high-temperature

Akira Yoshiasa, Kei Ichiro Murai, Hiroshi Arima, Yoshinori Katayama

Research output: Contribution to journalArticlepeer-review

Abstract

Precise structure analyses of advanced materials under pressure were performed using each advantage of X-ray absorption fine structure (XAFS) and diffraction methods. Measurements were performed in-situ under pressure and temperature using a large-volume multi-anvil pressure apparatus and synchrotron radiation. XAFS spectra are useful for phase study under high temperature and high pressure. The XAFS Debye Waller factor provides anharmonic effective pair potential with a pressure-dependent and temperature-independent shape. The phonon energies and anharmonicity are affected largely by the change in local structure and bonding character.

Original languageEnglish
Pages (from-to)4159-4162
Number of pages4
JournalInternational Journal of Modern Physics B
Volume25
Issue number31
DOIs
Publication statusPublished - 2011 Dec 20

Keywords

  • Debye-Waller factor
  • combined XAFS and XRD
  • high pressure and high temperature

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Condensed Matter Physics

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