Precise resistance measurement of quantum anomalous Hall effect in magnetic heterostructure film of topological insulator

Yuma Okazaki, Takehiko Oe, Minoru Kawamura, Ryutaro Yoshimi, Shuji Nakamura, Shintaro Takada, Masataka Mogi, Kei S. Takahashi, Atsushi Tsukazaki, Masashi Kawasaki, Yoshinori Tokura, Nobu Hisa Kaneko

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The accuracy of Hall resistance in the quantum anomalous Hall effect has been studied at zero magnetic field using Crx(Bi,Sb) 2 - x Te3-based magnetic heterostructure films of topological insulators. The measured deviation of the Hall resistance from its theoretical value h / e 2 was less than 2 ppm when the source drain current was 30 nA. This result has verified that the quantization of the Hall resistance is very accurate in the magnetic heterostructure films and in the previously reported uniformly doped films.

Original languageEnglish
Article number143101
JournalApplied Physics Letters
Volume116
Issue number14
DOIs
Publication statusPublished - 2020 Apr 6

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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