Abstract
The morphological characterization on platelet-type hematite particles was carried out extensively by transmission electron microscopy (TEM). It was found that the thickness of platelet-type hematite particles could be precisely measured from TEM images and convergent-beam electron diffraction (CBED) patterns with the use of the imaging plate. Based on these analyses coupled with electron energy-loss spectroscopy (EELS) which is useful to evaluate the specimen thickness with a simple manner, the mean-free path for inelastic electron scattering of hematite was determined to be 120 nm at an accelerating voltage of 200 kV. Thus, it is expected that the thickness of other hematite particles with various shapes, which is difficult to measure from TEM images and CBED patterns, can now be easily evaluated through EELS.
| Original language | English |
|---|---|
| Pages (from-to) | 1369-1374 |
| Number of pages | 6 |
| Journal | Journal of Engineering and Applied Science |
| Volume | 38 |
| Issue number | 12 |
| Publication status | Published - 1998 Dec 1 |
ASJC Scopus subject areas
- Engineering(all)