Precise measurement of the LC parameters considering the multiple interferences in the LC cell for the quantitative evaluation of LC devices

Takahiro Ishinabe, Yuji Ohno, Tetsuya Miyashita, Tatsuo Uchida

Research output: Contribution to conferencePaperpeer-review

Abstract

A simple and highly accurate measurement method was devised for the refractive indices, alignment distribution and surface polar anchoring strength by considering the multiple interferences in the LC cell. The accurate measurement based on the new interference-included 2×2 matrix method resulted in the establishment of quantitative evaluation of LC devices.

Original languageEnglish
Pages81-84
Number of pages4
Publication statusPublished - 2009 Dec 1
Event16th International Display Workshops, IDW '09 - Miyazaki, Japan
Duration: 2009 Dec 92009 Dec 11

Other

Other16th International Display Workshops, IDW '09
CountryJapan
CityMiyazaki
Period09/12/909/12/11

ASJC Scopus subject areas

  • Hardware and Architecture
  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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