Precise measurement method of LC material parameters

T. Kishimoto, K. Wako, Takahiro Ishinabe, T. Miyashita, T. Uchida

Research output: Contribution to conferencePaperpeer-review

Abstract

A highly precise measurement method of LC material parameters was proposed. By application of new driving scheme of LC in the capacitance measurement, and compensation for the capacitance of alignment layer and the anchoring strength of LC cell, we obtained reliable measurement values using the numerical fitting method on the capacitance-voltage property of LC cell.

Original languageEnglish
Pages23-24
Number of pages2
Publication statusPublished - 2008 Dec 1
Event15th International Display Workshops, IDW '08 - Niigata, Japan
Duration: 2008 Dec 32008 Dec 5

Other

Other15th International Display Workshops, IDW '08
CountryJapan
CityNiigata
Period08/12/308/12/5

ASJC Scopus subject areas

  • Hardware and Architecture
  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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