Power spectra of surface roughness of light emitting tunnel junctions measured by scanning tunneling microscopy

K. Takeuchi, Y. Uehara, S. Ushioda, N. Mikoshiba, S. Morita

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

Using a scanning tunneling microscope (STM), we have measured the microscopic surface roughness of light emitting tunnel junctions (LETJ) which consist of thin films of Al, A1 oxide, and Au. The power spectrum of roughness obtained from the STM data was used to calculate the light emission spectrum, using a theory that takes into account the effect of surface roughness in first order perturbation. The calculated spectrum due to the term first order in roughness fits the measured emission spectrum very well, but when the term due to an unperturbed smooth surface is included, the fit becomes unsatisfactory. We conclude that the theory predicts a wrong ratio between the contribution from surface roughness and the contribution from a smooth surface.

Original languageEnglish
Pages (from-to)557-560
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume8
Issue number1
DOIs
Publication statusPublished - 1990 Jan

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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