Power noise measurements of cryptographic VLSI circuits regarding side-channel information leakage

Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yu-Ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Shivam Bhasin, Jean Luc Danger

Research output: Contribution to journalArticle

2 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science