Powder X-ray diffraction pattern of NbSi 1.9 containing planar stacking faults

    Research output: Contribution to journalArticlepeer-review


    The X-ray powder diffraction pattern of NbSi 1.9 prepared by heating Nb and Si powders with Na at 900 K for 48 h in Ar was analyzed by the Rietveld method. The broadening peaks of X-ray reflections suggested stacking faults of the C40 structure. The XRD pattern was simulated with a stacking fault model using DIFFaX.

    Original languageEnglish
    Pages (from-to)189-192
    Number of pages4
    Publication statusPublished - 2012 Mar


    • A. Intermetallics, Miscellaneous
    • B. Crystallography
    • C. Reaction synthesis
    • F. Diffraction

    ASJC Scopus subject areas

    • Chemistry(all)
    • Mechanics of Materials
    • Mechanical Engineering
    • Metals and Alloys
    • Materials Chemistry


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