Possibility of scanning electron microscope observation and energy dispersive X-ray analysis in microscale region of insulating samples using diluted ionic liquid

Susumu Imashuku, Tetsuo Kawakami, Long Ze, Jun Kawai

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

Abstract The possibility of scanning electron microscope (SEM) observation and energy dispersive X-ray (EDX) spectrometry analysis in microscale regions of insulating samples using diluted ionic liquid was investigated. It is possible to obtain clear secondary electron images of insulating samples such as a rock and mineral at 5,000 times magnification by dropping 10 μL of 1 wt% of 1-ethyl-3-methylimidazolium acetate (EMI-CH 3COO) diluted with ethanol onto the samples. We also obtained EDX spectra of the samples in microscale regions (∼5 μm 2) without overlapping EDX spectra of other minerals with different composition. It might be possible to perform quantitative analysis of the samples if a method that does not need standard samples is applied or an X-ray detector sensitive for light elements was attached. The method of dropping 1 wt% EMI-CH 3COO diluted with ethanol onto insulating samples is useful for SEM observation, EDX analysis in microscale regions, and the preservation of scarce rock and mineral samples because ionic liquid can be easily removed with acetone.

Original languageEnglish
Pages (from-to)365-370
Number of pages6
JournalMicroscopy and Microanalysis
Volume18
Issue number2
DOIs
Publication statusPublished - 2012 Apr
Externally publishedYes

Keywords

  • EDX
  • SEM
  • electrical charging
  • insulating sample
  • ionic liquid
  • microscale region

ASJC Scopus subject areas

  • Instrumentation

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