Positron annihilation study of microvoids in neutron-irradiated vanadium: Effects of oxygen impurities

T. Riewcharoon, Z. Tang, Y. Nagai, M. Hasegawa

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)

Abstract

Vanadium samples with controlled oxygen impurity content (6-2460 at.ppm) were irradiated with fast neutrons to a fluence of 8.3×1018 n/cm2 at about 100°C. Effects of oxygen impurities on the formation of irradiation-induced defects and the interaction between the defects and oxygen impurities are studied systematically by combining the positron lifetime and coincidence Doppler broadening (CDB) techniques. It is found that the lifetimes longer than 380 ps are due to positron trapped at irradiation-induced microvoids. From the CDB measurement, the fingerprints of oxygen-impurity decoration of the defects are found in the high momentum region.

Original languageEnglish
Pages (from-to)167-169
Number of pages3
JournalMaterials Science Forum
Volume363-365
DOIs
Publication statusPublished - 2001
Event12th International Conference on Positron Annihilation - Munchen, Germany
Duration: 2000 Aug 62000 Aug 12

Keywords

  • Coincidence Doppler broadening
  • Microvoids
  • Positron annihilation
  • Vanadium

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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