Polarization dependence of resonant inelastic X-ray scattering spectroscopy in correlated electron systems

Sumio Ishihara, Satoshi Ihara

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Resonant inelastic X-ray scattering (RIXS) at the transition-metal K-edge is studied as a tool to detect the electronic structure in correlated electron systems. We, in particular, focus on the polarization dependence of RIXS intensity and symmetry of the electronic excitations. It is shown that by analyzing the polarization of the initial and scattered X-rays, the symmetry of the 4 p orbitals are selected. Combined effects of the polarization of X-rays and the momentum transfer in the scattering are also studied.

Original languageEnglish
Pages (from-to)3184-3186
Number of pages3
JournalJournal of Physics and Chemistry of Solids
Volume69
Issue number12
DOIs
Publication statusPublished - 2008 Dec

Keywords

  • A. Oxides
  • C. X-ray diffraction
  • D. Electronic structure
  • D. Magnetic properties
  • D. Superconductivity

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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