Polarization-analyzed resonant inelastic x-ray scattering of the orbital excitations in KCuF3

K. Ishii, S. Ishihara, Y. Murakami, K. Ikeuchi, K. Kuzushita, T. Inami, K. Ohwada, M. Yoshida, I. Jarrige, N. Tatami, S. Niioka, D. Bizen, Y. Ando, J. Mizuki, S. Maekawa, Y. Endoh

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22 Citations (Scopus)


We report a Cu Kedge resonant inelastic x-ray scattering (RIXS) study of the orbital excitations in the orbital-ordered Mott insulator KCuF3. By performing the polarization analysis of the scattered photons, the excitation between the eg orbitals is successfully distinguished from the excitations from t2g to eg. The polarization dependence of the respective excitations is interpreted based on a phenomenological consideration of the symmetry of the RIXS process that yields a necessary condition for observing the excitations. Owing to our polarization analysis, we are able to measure the momentum dependence of the orbital excitation corresponding to the orbital degree of freedom over the whole Brillouin zone. The excitation is found to be dispersionless within our experimental resolution.

Original languageEnglish
Article number241101
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number24
Publication statusPublished - 2011 Jun 16

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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