Plastically deformed Si-crystal wafers for neutron-monochromator elements

H. Hiraka, K. Fujiwara, K. Yamada, K. Morishita, K. Nakajima

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


Plastically deformed Si-crystal wafers were characterized by monochromatic neutron diffraction. During the cylindrically curved deformation, a resolution-limit Bragg peak changes into a box-type angular profile in accordance with the bulk curvature, associated with an enhancement in the angle-integrated intensity (Iθ). Stacking such wafers is efficient in amplifying Iθ further. We propose an application to neutron-focusing monochromator (or analyzer) crystals in order to design a quite compact spectrometer.

Original languageEnglish
Pages (from-to)137-140
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue number1
Publication statusPublished - 2011 Apr 11


  • Mosaic crystal
  • Neutron monochromator
  • Neutron reflectivity
  • Plastically deformed Si wafer

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation


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