Piezoelectric activity in c-axis oriented LiNbO3/ZnO bilayers grown by laser ablation technique

Parmanand Sharma; K. Sreenivas; L. M. Belova; K. V. Rao

doi:10.1080/00150190500315467

Piezoelectric activity in c-axis oriented LiNbO₃/ZnO bilayers grown by laser ablation technique

Parmanand Sharma, K. Sreenivas, L. M. Belova, K. V. Rao

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

LiNbO₃/ZnO multi-layer with a preferred c-axis orientation has been grown on glass and SiO₂/Si substrates by laser ablation technique. The piezoelectric activity in as deposited films is demonstrated using a novel approach to the atomic force microscope. In the presence of an in plane low frequency (0.1 to 5 Hz) ac electric field, we monitor and image the induced piezoelectric response normal to the film plane between two electrodes.

Original language	English
Pages (from-to)	65-68
Number of pages	4
Journal	Ferroelectrics
Volume	329
DOIs	https://doi.org/10.1080/00150190500315467
Publication status	Published - 2005
Externally published	Yes

Keywords

Laser ablation
Piezoelectricity
Thin films

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150190500315467

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abstract = "LiNbO3/ZnO multi-layer with a preferred c-axis orientation has been grown on glass and SiO2/Si substrates by laser ablation technique. The piezoelectric activity in as deposited films is demonstrated using a novel approach to the atomic force microscope. In the presence of an in plane low frequency (0.1 to 5 Hz) ac electric field, we monitor and image the induced piezoelectric response normal to the film plane between two electrodes.",

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AU - Rao, K. V.

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AB - LiNbO3/ZnO multi-layer with a preferred c-axis orientation has been grown on glass and SiO2/Si substrates by laser ablation technique. The piezoelectric activity in as deposited films is demonstrated using a novel approach to the atomic force microscope. In the presence of an in plane low frequency (0.1 to 5 Hz) ac electric field, we monitor and image the induced piezoelectric response normal to the film plane between two electrodes.

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KW - Thin films

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