Abstract
LiNbO3/ZnO multi-layer with a preferred c-axis orientation has been grown on glass and SiO2/Si substrates by laser ablation technique. The piezoelectric activity in as deposited films is demonstrated using a novel approach to the atomic force microscope. In the presence of an in plane low frequency (0.1 to 5 Hz) ac electric field, we monitor and image the induced piezoelectric response normal to the film plane between two electrodes.
Original language | English |
---|---|
Pages (from-to) | 65-68 |
Number of pages | 4 |
Journal | Ferroelectrics |
Volume | 329 |
DOIs | |
Publication status | Published - 2005 |
Externally published | Yes |
Keywords
- Laser ablation
- Piezoelectricity
- Thin films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics