Photoemission (UPS and XPS) study of local structures of amorphous GeTe and GeSe films

Takashi Takahashi, Takasi Sagawa

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

In situ photoemission (UPS and XPS) measurements have been performed for amorphous GeTe and GeSe films deposited onto a cooled substrate during thermal annealing and crystallization of the films. It has been found that an amorphous film prepared at room temperature has a 4-2 coordinated local structure while a highly disordered film deposited onto a 77 K substrate is largely 3-3 coordinated and relaxes into the 4-2 coordinated structure upon thermal annealing.

Original languageEnglish
Pages (from-to)879-882
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume59-60
Issue numberPART 2
DOIs
Publication statusPublished - 1983 Dec

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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