Photoemission studies of the sputter-induced phase transformation on the Al-Cu-Fe surface

J. A. Barrow; V. Fournée; A. R. Ross; P. A. Thiel; M. Shimoda; A. P. Tsai

doi:10.1016/S0039-6028(03)00746-5

Photoemission studies of the sputter-induced phase transformation on the Al-Cu-Fe surface

J. A. Barrow, V. Fournée, A. R. Ross, P. A. Thiel, M. Shimoda, A. P. Tsai

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

The surface of a single grain icosahedral (i) Al-Cu-Fe quasicrystalline sample is studied as a function of annealing temperature using ultra-violet photoemission spectroscopy (UPS). Reflection high-energy electron diffraction and X-ray photoelectron spectroscopy are also performed to verify surface structure and composition. The sputtered surface shows structure and chemical composition consistent with that of β-Al-Cu-Fe cubic phase together with a sharp Fermi cut-off. With increasing annealing temperature, the surface structure and composition reverts to that of the quasicrystal. This transformation is correlated with a decrease of the spectral intensity at the Fermi level (E_F). Analysis of the UPS spectra in the region near E_F is performed by fitting the data with a pseudogap function.

Original language	English
Pages (from-to)	54-62
Number of pages	9
Journal	Surface Science
Volume	539
Issue number	1-3
DOIs	https://doi.org/10.1016/S0039-6028(03)00746-5
Publication status	Published - 2003 Aug 1
Externally published	Yes

Keywords

Ion etching
Reflection high-energy electron diffraction (RHEED)
Sputtering
Surface relaxation and reconstruction
Visible and ultraviolet photoelectron spectroscopy
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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title = "Photoemission studies of the sputter-induced phase transformation on the Al-Cu-Fe surface",

abstract = "The surface of a single grain icosahedral (i) Al-Cu-Fe quasicrystalline sample is studied as a function of annealing temperature using ultra-violet photoemission spectroscopy (UPS). Reflection high-energy electron diffraction and X-ray photoelectron spectroscopy are also performed to verify surface structure and composition. The sputtered surface shows structure and chemical composition consistent with that of β-Al-Cu-Fe cubic phase together with a sharp Fermi cut-off. With increasing annealing temperature, the surface structure and composition reverts to that of the quasicrystal. This transformation is correlated with a decrease of the spectral intensity at the Fermi level (EF). Analysis of the UPS spectra in the region near EF is performed by fitting the data with a pseudogap function.",

keywords = "Ion etching, Reflection high-energy electron diffraction (RHEED), Sputtering, Surface relaxation and reconstruction, Visible and ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy",

author = "Barrow, {J. A.} and V. Fourn{\'e}e and Ross, {A. R.} and Thiel, {P. A.} and M. Shimoda and Tsai, {A. P.}",

year = "2003",

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T1 - Photoemission studies of the sputter-induced phase transformation on the Al-Cu-Fe surface

AU - Barrow, J. A.

AU - Fournée, V.

AU - Ross, A. R.

AU - Thiel, P. A.

AU - Shimoda, M.

AU - Tsai, A. P.

PY - 2003/8/1

Y1 - 2003/8/1

N2 - The surface of a single grain icosahedral (i) Al-Cu-Fe quasicrystalline sample is studied as a function of annealing temperature using ultra-violet photoemission spectroscopy (UPS). Reflection high-energy electron diffraction and X-ray photoelectron spectroscopy are also performed to verify surface structure and composition. The sputtered surface shows structure and chemical composition consistent with that of β-Al-Cu-Fe cubic phase together with a sharp Fermi cut-off. With increasing annealing temperature, the surface structure and composition reverts to that of the quasicrystal. This transformation is correlated with a decrease of the spectral intensity at the Fermi level (EF). Analysis of the UPS spectra in the region near EF is performed by fitting the data with a pseudogap function.

AB - The surface of a single grain icosahedral (i) Al-Cu-Fe quasicrystalline sample is studied as a function of annealing temperature using ultra-violet photoemission spectroscopy (UPS). Reflection high-energy electron diffraction and X-ray photoelectron spectroscopy are also performed to verify surface structure and composition. The sputtered surface shows structure and chemical composition consistent with that of β-Al-Cu-Fe cubic phase together with a sharp Fermi cut-off. With increasing annealing temperature, the surface structure and composition reverts to that of the quasicrystal. This transformation is correlated with a decrease of the spectral intensity at the Fermi level (EF). Analysis of the UPS spectra in the region near EF is performed by fitting the data with a pseudogap function.

KW - Ion etching

KW - Reflection high-energy electron diffraction (RHEED)

KW - Sputtering

KW - Surface relaxation and reconstruction

KW - Visible and ultraviolet photoelectron spectroscopy

KW - X-ray photoelectron spectroscopy

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DO - 10.1016/S0039-6028(03)00746-5

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VL - 539

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EP - 62

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 1-3

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