Photoemission studies of the sputter-induced phase transformation on the Al-Cu-Fe surface

J. A. Barrow, V. Fournée, A. R. Ross, P. A. Thiel, M. Shimoda, A. P. Tsai

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

The surface of a single grain icosahedral (i) Al-Cu-Fe quasicrystalline sample is studied as a function of annealing temperature using ultra-violet photoemission spectroscopy (UPS). Reflection high-energy electron diffraction and X-ray photoelectron spectroscopy are also performed to verify surface structure and composition. The sputtered surface shows structure and chemical composition consistent with that of β-Al-Cu-Fe cubic phase together with a sharp Fermi cut-off. With increasing annealing temperature, the surface structure and composition reverts to that of the quasicrystal. This transformation is correlated with a decrease of the spectral intensity at the Fermi level (EF). Analysis of the UPS spectra in the region near EF is performed by fitting the data with a pseudogap function.

Original languageEnglish
Pages (from-to)54-62
Number of pages9
JournalSurface Science
Volume539
Issue number1-3
DOIs
Publication statusPublished - 2003 Aug 1
Externally publishedYes

Keywords

  • Ion etching
  • Reflection high-energy electron diffraction (RHEED)
  • Sputtering
  • Surface relaxation and reconstruction
  • Visible and ultraviolet photoelectron spectroscopy
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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