Photoelectron spectroscopy with phases of standing waves observed by total electron yield and reflection spectra

T. Ejima, A. Yamazaki, K. Sato, Y. Nakamura

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Photoelectron spectroscopy using standing waves generated by a reflection multilayer is an effective method for investigating electronic and/or chemical structures at interfaces. Changes in photoelectron spectra are difficult to measure when the standing wave phase is changed, because no known method exists to measure phases in situ. In this study however, we present a method to measure the phases of standing waves in situ by combining the reflection and total electron yield spectra. The photoelectron spectra of Fe/Si/Fe trilayers deposited on a Mo/Si reflection multilayer were demonstrated by the phase results.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1634-1637
Number of pages4
DOIs
Publication statusPublished - 2007 Mar 26
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: 2006 May 28 → 2006 Jun 28

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period06/5/28 → 06/6/28

Keywords

  • Fe/Si/Fe trilayer
  • Multilayer
  • Phase
  • Photoemission
  • Reflectance
  • Standing wave
  • Thickness of uppermost layer
  • Total electron yield

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Ejima, T., Yamazaki, A., Sato, K., & Nakamura, Y. (2007). Photoelectron spectroscopy with phases of standing waves observed by total electron yield and reflection spectra. In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation (pp. 1634-1637). (AIP Conference Proceedings; Vol. 879). https://doi.org/10.1063/1.2436380