Abstract
Single-domain Si(001)2×1-K and -Cs surfaces have been studied by angle-resolved ultraviolet photoelectron spectroscopy and X-ray photoelectron diffraction. Dispersions of two surface-state bands that would be occupied with electrons from K4s states and Si-dimer dangling bonds are identified by ARUPS. An XPD study for the SD Si(001)2×1-Cs surface has further reinforced the reliability of an alkali-double-layer model. A negative-electron-affinity surface has been made by exposing the SD Si(001)2×1-Cs surface to oxygen. It is found from XPD that the framework of the Cs-double-layer is not affected by O2-exposure and that oxygen adsorption takes place at a level which is coplanar with the lower Cs-layers.
Original language | English |
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Pages (from-to) | 75-81 |
Number of pages | 7 |
Journal | Applied Surface Science |
Volume | 41-42 |
Issue number | C |
DOIs | |
Publication status | Published - 1990 Jan 1 |
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films