Photoelectron spectra enhanced by x-ray total reflection and diffraction from periodic multilayer

Koichi Hayashi, Shin'Ichi Kawato, Toshihisa Horiuchi, Kazumi Matsushige, Yoshinori Kitajima, Hisataka Takenaka, Jun Kawai

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

Photoelectron spectra from a periodic multilayer of (Mo/B4C)30/Si were measured by changing the x-ray glancing angle. The angular dependencies of the photoelectron intensities of O1s and Mo3d revealed the atomic depth profiles of the Mo oxide overlayer, and the compositions of the MoO3 upper layer and MoO2 lower layer. Furthermore, we observed enhancement of photoelectron emission by means of x-ray standing waves generated near the multilayer surface during x-ray diffraction from the superlattice.

Original languageEnglish
Pages (from-to)1921-1923
Number of pages3
JournalApplied Physics Letters
Volume68
Issue number14
DOIs
Publication statusPublished - 1996 Dec 1

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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