Phase-sensitive imaging and phase tomography using X-ray interferometers

Research output: Contribution to journalArticlepeer-review

241 Citations (Scopus)


X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed.

Original languageEnglish
Pages (from-to)2303-2314
Number of pages12
JournalOptics Express
Issue number19
Publication statusPublished - 2003 Sep
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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