Parametric investigations for frequency-domain lifetime psp technique (FLIM)

Hitomi Sato, Daisuke Yorita, Michael Hilfer, Ulrich Henne, Christian Klein, Yuji Saito, Taku Nonomura, Keisuke Asai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The effects of measurement parameters on frequency-domain fluorescence lifetime imaging (FLIM) with a new CMOS camera sensor (pco.flim) were investigated. The phase and demodulation indices were calculated from acquired images, and a function for the pressure is constructed. Pressure calibration tests performed with changing measurement parameters illustrate that increasing excitation modulation frequency significantly increases the pressure sensitivity but has a negative effect on a signal-to-noise ratio. The excitation modulation amplitude and its offset should be as high as possible for the reduction of the shot-noise influence. The pressure error calculated from the normalized phase index was the smallest at the modulation frequency of 20 kHz, while that from normalized demodulation index decreased as the modulation frequency increased. An impinging jet test has been conducted and the applicability of FLIM-PSP technique was investigated. Pressure distribution obtained from the test at the modulation frequencies of 20 kHz and 80 kHz were successfully compared to the pressure tap measurements. Considering the pressure error evaluation, the best results using the phase and demodulation indices were obtained at the modulation frequencies of 20 kHz and 80 kHz, respectively.

Original languageEnglish
Title of host publicationAIAA Scitech 2020 Forum
PublisherAmerican Institute of Aeronautics and Astronautics Inc, AIAA
ISBN (Print)9781624105951
DOIs
Publication statusPublished - 2020
EventAIAA Scitech Forum, 2020 - Orlando, United States
Duration: 2020 Jan 62020 Jan 10

Publication series

NameAIAA Scitech 2020 Forum
Volume1 PartF

Conference

ConferenceAIAA Scitech Forum, 2020
CountryUnited States
CityOrlando
Period20/1/620/1/10

ASJC Scopus subject areas

  • Aerospace Engineering

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