P-Si(1 1 1):H/ionic liquid interface investigated through a combination of electrochemical measurements and reflection high energy electron diffraction surface analysis in vacuum

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A combination study of electrochemical measurements and reflection high energy electron diffraction (RHEED) surface analysis experiments in a vacuum was first demonstrated to characterize a p-Si(1 1 1):H/ionic liquid interface. Mott-Schottky plot analysis was made to successfully not only evaluate the acceptor density and flat band potential of the p-Si(1 1 1):H, but also get some insight into its surface states. Furthermore, the electric double layer capacitance and specific adsorption properties at the IL/Si(1 1 1):H interface as well as the electrochemical interface stability will be discussed in this paper.

Original languageEnglish
Pages (from-to)6-10
Number of pages5
JournalChemical Physics Letters
Volume655-656
DOIs
Publication statusPublished - 2016 Jul 1

Keywords

  • Electrochemistry
  • Interface
  • Ionic liquid
  • RHEED
  • Semiconductor
  • Vacuum

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Fingerprint Dive into the research topics of 'P-Si(1 1 1):H/ionic liquid interface investigated through a combination of electrochemical measurements and reflection high energy electron diffraction surface analysis in vacuum'. Together they form a unique fingerprint.

  • Cite this