Oxygen surface exchange of Y0.2Ce0.8O2-x under reducing atmosphere

Teruhisa Horita; Katsuhiko Yamaji; Natsuko Sakai; Masahiko Ishikawa; Harumi Yokokawa; Tatsuya Kawada; Masayuki Dokiya

doi:10.1149/1.1390616

Oxygen surface exchange of Y_0.2Ce_0.8O_2-x under reducing atmosphere

Teruhisa Horita, Katsuhiko Yamaji, Natsuko Sakai, Masahiko Ishikawa, Harumi Yokokawa, Tatsuya Kawada, Masayuki Dokiya

ENV - Environmental Studies for Advanced Society

Research output: Contribution to journal › Article › peer-review

34 Citations (Scopus)

Abstract

Oxygen surface exchange was measured for Y_0.2Ce_0.8O_2-x (YDC) and Y_0.15Zr_0.85O_2-y (YSZ) over a wide range of oxygen partial pressures (7.3 × 10^-21 to 0.17 bar) by isotope oxygen exchange (¹⁸O/¹⁶O) using secondary-ion mass spectrometry analysis at 973 K. Diffusion depth profiles of ¹⁸O in YDC and YSZ were analyzed by an appropriate fitting equation to calculate diffusion coefficient (D) and surface exchange coefficient (k). The diffusion coefficients (D) for YDC and YSZ are consistent with the reference data. The k values for both materials were similar (about k = 5-9 × 10^-8 cm s^-1) at the same temperatures. The k value increases with decreasing oxygen partial pressure for both YDC and YSZ. A relationship between the k value and the concentrations of electron and oxygen vacancy is discussed.

Original language	English
Pages (from-to)	4-6
Number of pages	3
Journal	Electrochemical and Solid-State Letters
Volume	1
Issue number	1
DOIs	https://doi.org/10.1149/1.1390616
Publication status	Published - 1998 Jul

ASJC Scopus subject areas

Chemical Engineering(all)
Materials Science(all)
Physical and Theoretical Chemistry
Electrochemistry
Electrical and Electronic Engineering

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title = "Oxygen surface exchange of Y0.2Ce0.8O2-x under reducing atmosphere",

abstract = "Oxygen surface exchange was measured for Y0.2Ce0.8O2-x (YDC) and Y0.15Zr0.85O2-y (YSZ) over a wide range of oxygen partial pressures (7.3 × 10-21 to 0.17 bar) by isotope oxygen exchange (18O/16O) using secondary-ion mass spectrometry analysis at 973 K. Diffusion depth profiles of 18O in YDC and YSZ were analyzed by an appropriate fitting equation to calculate diffusion coefficient (D) and surface exchange coefficient (k). The diffusion coefficients (D) for YDC and YSZ are consistent with the reference data. The k values for both materials were similar (about k = 5-9 × 10-8 cm s-1) at the same temperatures. The k value increases with decreasing oxygen partial pressure for both YDC and YSZ. A relationship between the k value and the concentrations of electron and oxygen vacancy is discussed.",

author = "Teruhisa Horita and Katsuhiko Yamaji and Natsuko Sakai and Masahiko Ishikawa and Harumi Yokokawa and Tatsuya Kawada and Masayuki Dokiya",

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T1 - Oxygen surface exchange of Y0.2Ce0.8O2-x under reducing atmosphere

AU - Horita, Teruhisa

AU - Yamaji, Katsuhiko

AU - Sakai, Natsuko

AU - Ishikawa, Masahiko

AU - Yokokawa, Harumi

AU - Kawada, Tatsuya

AU - Dokiya, Masayuki

PY - 1998/7

Y1 - 1998/7

N2 - Oxygen surface exchange was measured for Y0.2Ce0.8O2-x (YDC) and Y0.15Zr0.85O2-y (YSZ) over a wide range of oxygen partial pressures (7.3 × 10-21 to 0.17 bar) by isotope oxygen exchange (18O/16O) using secondary-ion mass spectrometry analysis at 973 K. Diffusion depth profiles of 18O in YDC and YSZ were analyzed by an appropriate fitting equation to calculate diffusion coefficient (D) and surface exchange coefficient (k). The diffusion coefficients (D) for YDC and YSZ are consistent with the reference data. The k values for both materials were similar (about k = 5-9 × 10-8 cm s-1) at the same temperatures. The k value increases with decreasing oxygen partial pressure for both YDC and YSZ. A relationship between the k value and the concentrations of electron and oxygen vacancy is discussed.

AB - Oxygen surface exchange was measured for Y0.2Ce0.8O2-x (YDC) and Y0.15Zr0.85O2-y (YSZ) over a wide range of oxygen partial pressures (7.3 × 10-21 to 0.17 bar) by isotope oxygen exchange (18O/16O) using secondary-ion mass spectrometry analysis at 973 K. Diffusion depth profiles of 18O in YDC and YSZ were analyzed by an appropriate fitting equation to calculate diffusion coefficient (D) and surface exchange coefficient (k). The diffusion coefficients (D) for YDC and YSZ are consistent with the reference data. The k values for both materials were similar (about k = 5-9 × 10-8 cm s-1) at the same temperatures. The k value increases with decreasing oxygen partial pressure for both YDC and YSZ. A relationship between the k value and the concentrations of electron and oxygen vacancy is discussed.

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