Abstract
Oxygen isotope exchange experiments were carried out with a dense La0.6Sr0.4CoO3-δ film (0.5 μm thick) deposited on a Ce0.9Ca0.1O1.9 substrate by a laser ablation method. The isotope exchange profile was measured from the surface into the electrolyte by a secondary ion mass spectrometer (SIMS). The oxygen diffusion through the La0.6Sr0.4CoO3δ film was fast enough not to make any observable gradient in oxygen isotope concentration inside the film. The surface isotope exchange rate, k*, was calculated from the diffusion profile into the electrolyte layer. The electrochemical impedance, σE, was compared with k*. The oxygen partial pressure dependence of those two parameters were quite similar. The absolute value of k* was larger than expected from σE by a factor of 2 or higher.
Original language | English |
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Pages (from-to) | 271-279 |
Number of pages | 9 |
Journal | Solid State Ionics |
Volume | 121 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1999 Jun |
Event | Proceedings of the 1997 11th International Conference on Solid State Ionics, SSI-97 - Honolulu, HI, USA Duration: 1997 Nov 16 → 1997 Nov 21 |
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics