TY - JOUR
T1 - Oscillation behavior of a high-temperature silicon droplet by the electromagnetic levitation technique superimposed with a static magnetic field
AU - Ozawa, S.
AU - Takenaga, N.
AU - Koda, T.
AU - Hibiya, T.
AU - Kobatake, Hidekazu
AU - Fukuyama, Hiroyuki
AU - Adachi, Masayoshi
AU - Watanabe, M.
AU - Awaji, Satoshi
PY - 2008/11/15
Y1 - 2008/11/15
N2 - When a static magnetic field was applied to a Si droplet levitated by an electromagnetic force, only one peak was observed to remain in the frequency spectrum. It was the objective of this work to clarify whether this peak can be assigned to the m = ± 2 oscillation or to the rotation of the droplet. By analyzing the behavior of the deflection angle of the droplet in a top view, we conclude that this peak is not due to the surface oscillation of the droplet but to the droplet rotation.
AB - When a static magnetic field was applied to a Si droplet levitated by an electromagnetic force, only one peak was observed to remain in the frequency spectrum. It was the objective of this work to clarify whether this peak can be assigned to the m = ± 2 oscillation or to the rotation of the droplet. By analyzing the behavior of the deflection angle of the droplet in a top view, we conclude that this peak is not due to the surface oscillation of the droplet but to the droplet rotation.
KW - Electromagnetic levitation
KW - Oscillating droplet method
KW - Sample rotation
KW - Surface oscillation
KW - Thermophysical property
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U2 - 10.1016/j.msea.2007.07.103
DO - 10.1016/j.msea.2007.07.103
M3 - Article
AN - SCOPUS:50949090926
VL - 495
SP - 50
EP - 53
JO - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing
JF - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing
SN - 0921-5093
IS - 1-2
ER -