Oscillation behavior of a high-temperature silicon droplet by the electromagnetic levitation technique superimposed with a static magnetic field

S. Ozawa, N. Takenaga, T. Koda, T. Hibiya, Hidekazu Kobatake, Hiroyuki Fukuyama, Masayoshi Adachi, M. Watanabe, Satoshi Awaji

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

When a static magnetic field was applied to a Si droplet levitated by an electromagnetic force, only one peak was observed to remain in the frequency spectrum. It was the objective of this work to clarify whether this peak can be assigned to the m = ± 2 oscillation or to the rotation of the droplet. By analyzing the behavior of the deflection angle of the droplet in a top view, we conclude that this peak is not due to the surface oscillation of the droplet but to the droplet rotation.

Original languageEnglish
Pages (from-to)50-53
Number of pages4
JournalMaterials Science and Engineering A
Volume495
Issue number1-2
DOIs
Publication statusPublished - 2008 Nov 15

Keywords

  • Electromagnetic levitation
  • Oscillating droplet method
  • Sample rotation
  • Surface oscillation
  • Thermophysical property

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Oscillation behavior of a high-temperature silicon droplet by the electromagnetic levitation technique superimposed with a static magnetic field'. Together they form a unique fingerprint.

Cite this