Abstract
When X-rays irradiate a sample surface of a scanning tunneling microscope (STM), a current between the STM tip and the sample is detected. This current originates from the electron emission from the sample surface, and can be used for surface analysis. The STM tip current was amplified using gaseous molecules; however, the direct ionization of molecules in the air affected the tip current measurement at normal air pressure. It was found that the optimum gaseous pressure was near 5 kPa, where the influence of the direct ionization could be ignored, although the amplification effect still occurred.
| Original language | English |
|---|---|
| Pages (from-to) | 1264-1267 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 36 |
| Issue number | 3 SUPPL. A |
| DOIs | |
| Publication status | Published - 1997 Mar |
| Externally published | Yes |
Keywords
- Electron emission
- Scanning tunneling microscope
- X-ray excited current
- X-ray fluorescence
- X-ray irradiation
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)