Optical scanning probe system for electromagnetic near field measurements

Masanori Takahashi, Katsumi Kawasaki, Hiroyuki Ohba, Tomokazu Ikenaga, Hiroyasu Ota, Tatsuru Orikasa, Nobuyasu Adachi, Kazushi Ishiyama, Ken Ichi Arai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

An optical scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We demonstrate the measurement of electric field distributions using a LiNbO 3 crystal substrate and the probe system. We also measure magnetic field distributions above a microstrip line in the gigahertz range using a magnetic garnet thin film. The probe system is also used for measuring electromagnetic field distributions above a commercially available IC.

Original languageEnglish
Title of host publication2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
Pages6-11
Number of pages6
DOIs
Publication statusPublished - 2009
Event2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 - Austin, TX, United States
Duration: 2009 Aug 172009 Aug 21

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Other

Other2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
CountryUnited States
CityAustin, TX
Period09/8/1709/8/21

Keywords

  • Electro-optic effect
  • Electromagnetic field
  • Galvano scanner
  • Magneto-optic effect

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Optical scanning probe system for electromagnetic near field measurements'. Together they form a unique fingerprint.

Cite this