Optical constants of very thin Pt and Rh films determined from soft-X-ray reflectance and photoelectric yield measurements

Maehara Takumi Maehara, Yanagihara Mihiro Yanagihara, Yamamoto Masaki Yamamoto, Namioka Takeshi Namioka

Research output: Contribution to journalArticle

Abstract

Optical constants of very thin platinum and rhodium films for soft X-rays (70-900 eV) have been determined using two techniques of independent measurements of the reflectance and the total photoelectric yield for the same samples. The measured reflectances were analyzed with a plane parallel slab model with a Debye-Waller factor, with consideration given to the surface roughness. The total photoelectric yield data were examined with a model based upon Pepper's formula. The corresponding optical constants agreed well with each other, showing the degree of reliability on the optical constants in the soft X-ray region.

Original languageEnglish
Pages (from-to)362-367
Number of pages6
JournalNuclear Inst. and Methods in Physics Research, B
Volume74
Issue number3
DOIs
Publication statusPublished - 1993 May 2

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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