Optical constants of SiC mirrors produced by different methods for photons of 60-1000 eV

Mihiro Yanagihara; Jianlin Cao; Masaki Yamamoto; Takeshi Namioka; Shigeru Sato; Tsuneharu Koide; Shigekatsu Takeda; Akio Iijima

doi:10.1063/1.1140868

Optical constants of SiC mirrors produced by different methods for photons of 60-1000 eV

Mihiro Yanagihara, Jianlin Cao, Masaki Yamamoto, Takeshi Namioka, Shigeru Sato, Tsuneharu Koide, Shigekatsu Takeda, Akio Iijima

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The optical constants of seven CVD-SiC mirrors produced by different processes and a sintered SiC mirror have been measured in the soft x-ray region by means of the reflectance method. Although they are different in the crystal structure, the optical constants of the CVD-SiC mirrors are almost independent of the samples over the measured 200-1000 eV range. But the optical constants of the sintered SiC differ from those of the CVD-SiC mirrors over the measured range of 60-1000 eV. The photon-energy dependence of the optical constants of CVD-SiC is represented in terms of power formulas above 300 eV.

Original language	English
Pages (from-to)	2030-2033
Number of pages	4
Journal	Review of Scientific Instruments
Volume	60
Issue number	7
DOIs	https://doi.org/10.1063/1.1140868
Publication status	Published - 1989
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1140868

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Optical constants of SiC mirrors produced by different methods for photons of 60-1000 eV. / Yanagihara, Mihiro; Cao, Jianlin; Yamamoto, Masaki; Namioka, Takeshi; Sato, Shigeru; Koide, Tsuneharu; Takeda, Shigekatsu; Iijima, Akio.

In: Review of Scientific Instruments, Vol. 60, No. 7, 1989, p. 2030-2033.

Research output: Contribution to journal › Article › peer-review

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abstract = "The optical constants of seven CVD-SiC mirrors produced by different processes and a sintered SiC mirror have been measured in the soft x-ray region by means of the reflectance method. Although they are different in the crystal structure, the optical constants of the CVD-SiC mirrors are almost independent of the samples over the measured 200-1000 eV range. But the optical constants of the sintered SiC differ from those of the CVD-SiC mirrors over the measured range of 60-1000 eV. The photon-energy dependence of the optical constants of CVD-SiC is represented in terms of power formulas above 300 eV.",

author = "Mihiro Yanagihara and Jianlin Cao and Masaki Yamamoto and Takeshi Namioka and Shigeru Sato and Tsuneharu Koide and Shigekatsu Takeda and Akio Iijima",

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AU - Yanagihara, Mihiro

AU - Cao, Jianlin

AU - Yamamoto, Masaki

AU - Namioka, Takeshi

AU - Sato, Shigeru

AU - Koide, Tsuneharu

AU - Takeda, Shigekatsu

AU - Iijima, Akio

PY - 1989

Y1 - 1989

N2 - The optical constants of seven CVD-SiC mirrors produced by different processes and a sintered SiC mirror have been measured in the soft x-ray region by means of the reflectance method. Although they are different in the crystal structure, the optical constants of the CVD-SiC mirrors are almost independent of the samples over the measured 200-1000 eV range. But the optical constants of the sintered SiC differ from those of the CVD-SiC mirrors over the measured range of 60-1000 eV. The photon-energy dependence of the optical constants of CVD-SiC is represented in terms of power formulas above 300 eV.

AB - The optical constants of seven CVD-SiC mirrors produced by different processes and a sintered SiC mirror have been measured in the soft x-ray region by means of the reflectance method. Although they are different in the crystal structure, the optical constants of the CVD-SiC mirrors are almost independent of the samples over the measured 200-1000 eV range. But the optical constants of the sintered SiC differ from those of the CVD-SiC mirrors over the measured range of 60-1000 eV. The photon-energy dependence of the optical constants of CVD-SiC is represented in terms of power formulas above 300 eV.

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Optical constants of SiC mirrors produced by different methods for photons of 60-1000 eV

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