TY - GEN
T1 - On the evaluation of electromagnetic information leakage from mobile device screens
AU - Yli Maeyry, Ville Oskari
AU - Miyata, Daisuke
AU - Homma, Naofumi
AU - Aoki, Takafumi
AU - Hayashi, Yu-Ichi
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/22
Y1 - 2018/6/22
N2 - We present a statistical testing based methodology for evaluating electromagnetic radiation from a tested mobile device that potentially contains exploitable information for re-constructing screen images of the device. The basic idea is to employ a statistical test instead of reconstructing screen images. The validity of our methodology is demonstrated in a real-world setting by an experiment observing EM radiation from a tablet device's screen that would be usable in a TEMPEST attack.
AB - We present a statistical testing based methodology for evaluating electromagnetic radiation from a tested mobile device that potentially contains exploitable information for re-constructing screen images of the device. The basic idea is to employ a statistical test instead of reconstructing screen images. The validity of our methodology is demonstrated in a real-world setting by an experiment observing EM radiation from a tablet device's screen that would be usable in a TEMPEST attack.
KW - Information leakage
KW - Side-channel analysis
KW - Statistical test
KW - TEMPEST
UR - http://www.scopus.com/inward/record.url?scp=85050145631&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85050145631&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2018.8393945
DO - 10.1109/ISEMC.2018.8393945
M3 - Conference contribution
AN - SCOPUS:85050145631
T3 - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
SP - 1050
EP - 1052
BT - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Y2 - 14 May 2018 through 18 May 2018
ER -