@inproceedings{ac6bcfd29d0742999b3ea5a7c5d236eb,
title = "On the evaluation of electromagnetic information leakage from mobile device screens",
abstract = "We present a statistical testing based methodology for evaluating electromagnetic radiation from a tested mobile device that potentially contains exploitable information for re-constructing screen images of the device. The basic idea is to employ a statistical test instead of reconstructing screen images. The validity of our methodology is demonstrated in a real-world setting by an experiment observing EM radiation from a tablet device's screen that would be usable in a TEMPEST attack.",
keywords = "Information leakage, Side-channel analysis, Statistical test, TEMPEST",
author = "Ville Yli-M{\"a}yry and Daisuke Miyata and Naofumi Homma and Takafumi Aoki and Yu-Ichi Hayashi",
year = "2018",
month = jun,
day = "22",
doi = "10.1109/ISEMC.2018.8393945",
language = "English",
series = "2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1050--1052",
booktitle = "2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018",
note = "60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 ; Conference date: 14-05-2018 Through 18-05-2018",
}