On the evaluation of electromagnetic information leakage from mobile device screens

Ville Oskari Yli Maeyry; Daisuke Miyata; Naofumi Homma; Takafumi Aoki; Yu-Ichi Hayashi

doi:10.1109/ISEMC.2018.8393945

On the evaluation of electromagnetic information leakage from mobile device screens

Ville Oskari Yli Maeyry, Daisuke Miyata, Naofumi Homma, Takafumi Aoki, Yu-Ichi Hayashi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We present a statistical testing based methodology for evaluating electromagnetic radiation from a tested mobile device that potentially contains exploitable information for re-constructing screen images of the device. The basic idea is to employ a statistical test instead of reconstructing screen images. The validity of our methodology is demonstrated in a real-world setting by an experiment observing EM radiation from a tablet device's screen that would be usable in a TEMPEST attack.

Original language	English
Title of host publication	2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1050-1052
Number of pages	3
ISBN (Electronic)	9781509059973
DOIs	https://doi.org/10.1109/ISEMC.2018.8393945
Publication status	Published - 2018 Jun 22
Event	60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore Duration: 2018 May 14 → 2018 May 18

Publication series

Name	2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

Other

Other	60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Country/Territory	Singapore
City	Suntec City
Period	18/5/14 → 18/5/18

Keywords

Information leakage
Side-channel analysis
Statistical test
TEMPEST

ASJC Scopus subject areas

Aerospace Engineering
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Radiation

Access to Document

10.1109/ISEMC.2018.8393945

Cite this

Yli Maeyry, V. O., Miyata, D., Homma, N., Aoki, T., & Hayashi, Y-I. (2018). On the evaluation of electromagnetic information leakage from mobile device screens. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (pp. 1050-1052). (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.2018.8393945

On the evaluation of electromagnetic information leakage from mobile device screens. / Yli Maeyry, Ville Oskari; Miyata, Daisuke; Homma, Naofumi et al.

2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1050-1052 (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yli Maeyry, VO, Miyata, D, Homma, N , Aoki, T & Hayashi, Y-I 2018, On the evaluation of electromagnetic information leakage from mobile device screens. in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018, Institute of Electrical and Electronics Engineers Inc., pp. 1050-1052, 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018, Suntec City, Singapore, 18/5/14. https://doi.org/10.1109/ISEMC.2018.8393945

Yli Maeyry VO, Miyata D, Homma N , Aoki T, Hayashi Y-I. On the evaluation of electromagnetic information leakage from mobile device screens. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1050-1052. (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018). https://doi.org/10.1109/ISEMC.2018.8393945

Yli Maeyry, Ville Oskari ; Miyata, Daisuke ; Homma, Naofumi et al. / On the evaluation of electromagnetic information leakage from mobile device screens. 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1050-1052 (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018).

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On the evaluation of electromagnetic information leakage from mobile device screens

Abstract

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Keywords

ASJC Scopus subject areas

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