A new measuring method of the pinning potential, Uc, for thermally activated flux creep is proposed. By this type of resistive measurements, we can obtain the observed data of Uc even in the low field region, where the direct comparison with the observed data from the magnetization measurements is possible. The observed results of Uc by the present resistive measurements for a c-axis oriented CVD film of YBa2Cu3O7 at 77.3K were 0.05eV at 3T and 0.07eV at 2T, while Uc from the magnetization measurement was 0.09eV at 1T. The present results clearly resolved a strange puzzle that the values of Uc, which have been inferred from the observed data of the existing resitive method at higher temperatures by using the Malozemoff type of temperature dependence of Uc, are usually more than ten times larger than those obtained from the magnetization measurements. It is also pointed out that the use of Fujiyoshi type of temperature dependence of Uc leads to the values of Uc with the same order of magnitude as those form the magnetization measurements.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering