On the cover. Near-field scanning optical microscopy

Hitoshi Shiku, Robert C. Dunn

Research output: Contribution to journalReview articlepeer-review

20 Citations (Scopus)

Abstract

The resolution in conventional microscopy is limited by the wavelength of light. Near-field scanning optical microscopy (NSOM) is designed to avoid diffraction limits, providing resolution of nanometer-sized samples. Hitoshi Shiku and Robert C. Dunn of the University of Kansas describe the concepts behind NSOM and illustrate some of its applications.

Original languageEnglish
JournalAnalytical Chemistry
Volume71
Issue number1
Publication statusPublished - 1999 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Analytical Chemistry

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