On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

S. Amakawa, K. Takano, K. Katayama, M. Motoyoshi, T. Yoshida, M. Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Fingerprint

Dive into the research topics of 'On the choice of cascade de-embedding methods for on-wafer S-parameter measurement'. Together they form a unique fingerprint.

Engineering & Materials Science