On-chip power noise measurements of cryptographic VLSI circuits and interpretation for side-channel analysis

Daisuke Fujimoto, Noriyuki Miura, Yu-Ichi Hayashi, Naofumi Homma, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Jean Luc Danger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

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