On-chip power noise measurements of cryptographic VLSI circuits and interpretation for side-channel analysis

Daisuke Fujimoto, Noriyuki Miura, Yu-Ichi Hayashi, Naofumi Homma, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Jean Luc Danger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Power noise waveforms within cryptographic VLSI circuits in a 65 nm CMOS technology are captured by using an on-chip voltage waveform monitor (OCM). The waveform measurements emphasize the correlation of dynamic voltage drops to internal logical activities during the processing of Advance Encryption Standard (AES), and resolve the physical processes in the information leakage of such as secret key bytes through Correlated Power Analysis (CPA). The time window of significant importance where the leakage most likely happens is clearly designated within a single clock cycle in the final stage of AES processing. The primary frequency components of power noise in the leakage are shown to be localized within an extremely low frequency region. The level of information leakage is strongly associated with the increase of dynamic voltage drops against increment of the Hamming distance in the AES processing. The on-chip power noise measurements unveil the facts about side-channel information leakage behind the traditional CPA with on-board sensing of power current through a resistor of 1 ohm.

Original languageEnglish
Title of host publicationProceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
Pages405-410
Number of pages6
Publication statusPublished - 2013 Dec 24
Event2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013 - Brugge, Belgium
Duration: 2013 Sep 22013 Sep 6

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
CountryBelgium
CityBrugge
Period13/9/213/9/6

Keywords

  • AES
  • Electromagnetic leakage
  • Information leakage
  • Side-channel attack

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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