Observing impurity doping in oxide grain boundaries using STEM

J. P. Buban, Y. Sato, K. Matsunaga, N. Shibata, T. Yamamoto, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)138-139
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume12
    Issue numberSUPPL. 2
    DOIs
    Publication statusPublished - 2006 Aug 1

    ASJC Scopus subject areas

    • Instrumentation

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