During the irradiation of white X-rays of synchrotron radiation on copper phthalocyanine thin film on a Si wafer (CuPc/Si) under the grazing incidence condition, X-rays from the end face of the CuPc layer were observed by solid state detector. These were understood to be refractions through the CuPc layer and reflections from the CuPc/Si, because their energy variation as a function of the X-ray exit angle followed Snell's law. We also discussed the similarities and differences between the observed phenomenon and X-ray waveguide phenomenon.
ASJC Scopus subject areas
- Physics and Astronomy(all)