Observation of polarization distribution on Si(111) surface by scanning nonlinear dielectric microscopy

Kohei Yamasue, Yasuo Cho

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) has the ability to simultaneously acquire the surface topography and polarization distribution at the nanoscale through the measurement of local nonlinear dielectric constants of materials. NC-SNDM was here applied to the observation of Si(111) reconstructed surfaces. Images of the polarization distribution clearly distinguished disordered regions of the surface, often called 1 × 1 regions, at the boundaries between the regular (7 × 7) domains. We acquired polarization images of surfaces with different sizes of 1 × 1 regions and show that NC-SNDM has the potential to image trapped charges of surfaces and interfaces.

Original languageEnglish
Article number09NE12
JournalJapanese journal of applied physics
Volume50
Issue number9 PART 3
DOIs
Publication statusPublished - 2011 Sep

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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