Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) has the ability to simultaneously acquire the surface topography and polarization distribution at the nanoscale through the measurement of local nonlinear dielectric constants of materials. NC-SNDM was here applied to the observation of Si(111) reconstructed surfaces. Images of the polarization distribution clearly distinguished disordered regions of the surface, often called 1 × 1 regions, at the boundaries between the regular (7 × 7) domains. We acquired polarization images of surfaces with different sizes of 1 × 1 regions and show that NC-SNDM has the potential to image trapped charges of surfaces and interfaces.
ASJC Scopus subject areas
- Physics and Astronomy(all)