Observation of nano-size ferroelectric domains and crystals polarity using scanning nonlinear dielectric microscopy

H. Odagawa, Y. Cho, S. Kazuta

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, is developed. This is achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as thin films of PZT on SrTiO3 substrates, are performed. Topographic and domain images, which are simultaneously taken from the same location of the materials, are successfully obtained. The result shows that nano-sized ferroelectric domain images for PZT thin film having a good correlation with a topographic image were observed. Moreover, we demonstrate that SNDM can measure the crystal polarity of a thin film deposited on a polar substrate without the influence of the substrate polarity.

Original languageEnglish
Pages (from-to)917/225-926/234
JournalIntegrated Ferroelectrics
Volume32
Issue number1-4
Publication statusPublished - 2001 Jan 1
Event12th International Symposium on Integrated Ferroelectrics - Aachen, Germany
Duration: 2000 Mar 122000 Mar 15

Keywords

  • Atomic force microscope
  • Determination of crystal polarity
  • Ferroelectric materials
  • Scanning nonlinear dielectric microscopy
  • ZnO thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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