Abstract
The details of the magnetization reversal process of Ni-Fe nanowires, which were 10, 30, and 50-nm thick, were successfully observed using our newly proposed magnetization measurement method, namely, magnetic field sweeping (MFS)-magnetic force microscopy (MFM). All the points within the nanowire show marked phase changes (stray fields change) as the magnetic field is varied. In particular, each nanowire edge displays a hysteresis loop, while the center shows a sharp jump or a plateau area. These results demonstrate that domain wall motion is dominant in the magnetization reversal process of a 10-nm-thick Ni-Fe nanowire and that domain wall motion along with domain wall pinning play important roles in the magnetization reversal process in both 30- and 50-nm-thick Ni-Fe nanowires.
Original language | English |
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Pages (from-to) | L898-L900 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 46 |
Issue number | 36-40 |
DOIs | |
Publication status | Published - 2007 Oct 12 |
Externally published | Yes |
Keywords
- Domain wall
- MFM
- Magnetization reversal process
- Nanoslzed magnet
- Ni-Fe nanowire
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy (miscellaneous)
- Physics and Astronomy(all)